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  1. Yan, B.; Luo, J.: Measuring technological distance for patent mapping (2017) 10.32 
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  2. Yan, B.; Luo, J.: Filtering patent maps for visualization of diversification paths of inventors and organizations (2017) 10.32 
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  3. Li, G.; Siddharth, L.; Luo, J.: Embedding knowledge graph of patent metadata to measure knowledge proximity (2023) 10.32 
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